Ferroelectric phase stabilization of HfO2 by nitrogen doping

被引:104
作者
Xu, Lun [1 ]
Nishimura, Tomonori [1 ]
Shibayama, Shigehisa [1 ]
Yajima, Takeaki [1 ]
Migita, Shinji [2 ]
Toriumi, Akira [1 ]
机构
[1] Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
[2] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058569, Japan
关键词
OXIDES; FILMS; ZRO2;
D O I
10.7567/APEX.9.091501
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report that nitrogen (N) doping can drive the ferroelectricity of HfO2. It was found that N doping can cause the transition from a monoclinic phase to a highly symmetric phase. The role of N doping is discussed from the viewpoints of charge balance and bond-constraining effects. The former is responsible for the structural transformation from a paraelectric phase to a ferroelectric phase by forming an oxygen vacancy. In addition, Hf-N and N-O bonds with covalent characteristics have strong effects on HfO2 structural and electrical properties, and thus contribute to a marked HfO2 para-/ferroelectric transition. (C) 2016 The Japan Society of Applied Physics
引用
收藏
页数:4
相关论文
共 25 条
[21]   Evidence for oxygen vacancies movement during wake-up in ferroelectric hafnium oxide [J].
Starschich, S. ;
Menzel, S. ;
Boettger, U. .
APPLIED PHYSICS LETTERS, 2016, 108 (03)
[22]   Chemical solution deposition of ferroelectric yttrium-doped hafnium oxide films on platinum electrodes [J].
Starschich, S. ;
Griesche, D. ;
Schneller, T. ;
Waser, R. ;
Boettger, U. .
APPLIED PHYSICS LETTERS, 2014, 104 (20)
[23]   Martensitic phase transformation of isolated HfO2, ZrO2, and HfxZr1-xO2 (0 < x < 1) nanocrystals [J].
Tang, J ;
Zhang, T ;
Zoogman, P ;
Fabbri, J ;
Chan, SW ;
Zhu, YM ;
Brus, LE ;
Steigerwald, ML .
ADVANCED FUNCTIONAL MATERIALS, 2005, 15 (10) :1595-1602
[24]   Passivation of oxygen vacancy states in HfO2 by nitrogen [J].
Xiong, K ;
Robertson, J ;
Clark, SJ .
JOURNAL OF APPLIED PHYSICS, 2006, 99 (04)
[25]   Insights into electrical characteristics of silicon doped hafnium oxide ferroelectric thin films [J].
Zhou, Dayu ;
Mueller, J. ;
Xu, Jin ;
Knebel, S. ;
Braeuhaus, D. ;
Schroeder, U. .
APPLIED PHYSICS LETTERS, 2012, 100 (08)