The electric field dependence of single electron emission in the PIXeY two-phase xenon detector

被引：3

作者：

Bodnia, E. ^{[1
,2
,5
]}

Bernard, E. P. ^{[1
,2
,3
]}

Biekert, A. ^{[1
]}

Boulton, E. M. ^{[1
,2
,3
]}

Cahn, S. B. ^{[3
]}

Destefano, N. ^{[4
,6
]}

Edwards, B. N. V. ^{[3
,7
]}

Gai, M. ^{[3
,4
]}

Horn, M. ^{[1
,2
,3
,8
]}

Larsen, N. A. ^{[3
,9
]}

Riffard, Q. ^{[2
]}

Tennyson, B. ^{[3
,6
]}

Velan, V. ^{[1
]}

Wahl, C. ^{[3
,10
]}

McKinsey, D. N. ^{[1
,2
,3
]}

机构：

[1] Univ Calif Berkeley, Dept Phys, 366 Phys North, Berkeley, CA 94720 USA

[2] Lawrence Berkeley Natl Lab, 1 Cyclotron Rd, Berkeley, CA 94720 USA

[3] Yale Univ, Dept Phys, 217 Prospect St, New Haven, CT 06511 USA

[4] Univ Connecticut, LNS Avery Point, 1084 Shennecossett Rd, Groton, CT 06340 USA

[5] Univ Calif Santa Barbara, Dept Phys, Broida Hall, Santa Barbara, CA 93106 USA

[6] Mitre Corp, 202 Burlington Rd, Bedford, MA 01730 USA

[7] IBM Res, STFC Daresbury Lab, Warrington WA4 4AD, Cheshire, England

[8] Sanford Underground Res Facil, 630 Summit St, Lead, SD USA

[9] Univ Chicago, Kavli Inst Cosmol Phys, 5640 Ellis Ave, Chicago, IL 60637 USA

[10] H3D Inc, 812 Avis Dr, Ann Arbor, MI 48108 USA

来源：

JOURNAL OF INSTRUMENTATION | 2021年 / 16卷 / 12期

关键词：

Dark Matter detectors (WIMPs; axions; etc.); Detector modelling and simulations II (electric fields; charge transport; multiplication and induction; pulse formation; electron emission; etc); Noble liquid detectors (scintillation; ionization; double-phase); Photoemission; FOWLER;

D O I：

10.1088/1748-0221/16/12/P12015

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Dual phase xenon detectors are widely used in experimental searches for galactic dark matter particles. The origin of single electron backgrounds following prompt scintillation and proportional scintillation signals in these detectors is not fully understood, although there has been progress in recent years. In this paper, we describe single electron backgrounds in Kr-83m calibration events and their correlation with drift and extraction fields, using the Particle Identification in Xenon at Yale (PIXeY) dual-phase xenon time projection chamber. The single electron background induced by the Fowler-Nordheim (FN) effect is measured, and its electric field dependence is quantified. The photoionization of grids and impurities by prompt scintillation and proportional scintillation also contributes to the single electron background.

引用

页数：20

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