Effect of instrumental instability and detector parameters in positron annihilation Coincidence Doppler Broadening measurements: a Monte Carlo simulation study

被引：0
作者：
Sudarshan, K [1 ]
Pujari, PK [1 ]
Goswami, A [1 ]
机构：
[1] Bhabha Atom Res Ctr, Div Radiochem, Bombay 400085, Maharashtra, India
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2003年 / 515卷 / 03期
关键词：
Coincidence Doppler Broadening; Monte-Carlo simulation; resolution and momentum distribution; positron annihilation;
D O I：
10.1016/j.nima.2003.07.014
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Two-detector Coincidence Doppler Broadening (CDB) spectra of a few hypothetical metallic samples have been simulated by Monte Carlo method to systematically study the effect of various instrumental parameters on the information extracted from these spectra. Effect of detector resolution on different regions of the relative momentum spectra has also been evaluated. The results showed that the detector resolution affects the CDB spectra to different extent depending on the relative contribution and momentum of the core and valence electrons to positron annihilation. (C) 2003 Elsevier B.V. All rights reserved.
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页码：862 / 868
页数：7
相关论文
共 12 条
[1]   IDENTIFICATION OF VACANCY DEFECTS IN COMPOUND SEMICONDUCTORS BY CORE-ELECTRON ANNIHILATION - APPLICATION TO INP [J].
ALATALO, M ;
KAUPPINEN, H ;
SAARINEN, K ;
PUSKA, MJ ;
MAKINEN, J ;
HAUTOJARVI, P ;
NIEMINEN, RM .
PHYSICAL REVIEW B, 1995, 51 (07) :4176-4185
[2]   Increased elemental specificity of positron annihilation spectra [J].
AsokaKumar, P ;
Alatalo, M ;
Ghosh, VJ ;
Kruseman, AC ;
Nielsen, B ;
Lynn, KG .
PHYSICAL REVIEW LETTERS, 1996, 77 (10) :2097-2100
[3]   The effect of the detector resolution on the Doppler broadening measurements of both valence and core electron-positron annihilation [J].
Ghosh, VJ ;
Nielsen, B ;
Kruseman, AC ;
Mijnarends, PR ;
van Veen, A ;
Lynn, KG .
APPLIED SURFACE SCIENCE, 1999, 149 (1-4) :234-237
[4]   Deconvoluting double Doppler spectra [J].
Ho, KF ;
Ng, KP ;
Beling, CD ;
Fung, S ;
Chan, KL ;
Tang, HW .
POSITRON ANNIHILATION - ICPA-12, 2001, 363-3 :673-675
[5]   Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system [J].
Kruseman, AC ;
Schut, H ;
vanVeen, A ;
Mijnarends, PE ;
Clement, M ;
deNijs, JMM .
APPLIED SURFACE SCIENCE, 1997, 116 :192-197
[6]   2-DIMENSIONAL DOPPLER BROADENED TECHNIQUE IN POSITRON-ANNIHILATION [J].
MACDONALD, JR ;
LYNN, KG ;
BOIE, RA ;
ROBBINS, MF .
NUCLEAR INSTRUMENTS & METHODS, 1978, 153 (01) :189-194
[7]  
Press W.H., 1992, NUMERICAL RECIPES FO
[8]   Positron annihilation studies in the MgB2 superconductor -: art. no. 012518 [J].
Pujari, PK ;
Sudarshan, K ;
Goswami, A ;
Manohar, SB ;
Aswal, DK ;
Singh, A ;
Sen, S ;
Gupta, SK .
PHYSICAL REVIEW B, 2002, 66 (01) :1-4
[9]   THEORY OF POSITRONS IN SOLIDS AND ON SOLID-SURFACES [J].
PUSKA, MJ ;
NIEMINEN, RM .
REVIEWS OF MODERN PHYSICS, 1994, 66 (03) :841-897
[10]   INTERACTION OF POSITRON BEAMS WITH SURFACES, THIN-FILMS, AND INTERFACES [J].
SCHULTZ, PJ ;
LYNN, KG .
REVIEWS OF MODERN PHYSICS, 1988, 60 (03) :701-779
12