Subangstrom resolution by underfocused incoherent transmission electron microscopy

被引：135
作者：
Nellist, PD
Pennycook, SJ
机构：
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[2] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA
来源：
PHYSICAL REVIEW LETTERS | 1998年 / 81卷 / 19期
关键词：
D O I：
10.1103/PhysRevLett.81.4156
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
It is quantitatively explained why incoherent transmission electron microscope imaging is extremely robust to the effects of chromatic aberration, which usually limits the resolution in the conventional coherent mode of imaging. Combining this robustness with using underfocus to counter the effects of spherical aberration, we demonstrate subangstrom lattice resolution and information transfer to 0.078 nm.
引用
收藏
页码：4156 / 4159
页数：4
相关论文
共 22 条
  • [1] SPHERICAL ABERRATION AND THE INFORMATION CONTENT OF OPTICAL IMAGES
    BLACK, G
    LINFOOT, EH
    [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1957, 239 (1219): : 522 - 540
  • [2] PHASE RETRIEVAL THROUGH FOCUS VARIATION FOR ULTRA-RESOLUTION IN FIELD-EMISSION TRANSMISSION ELECTRON-MICROSCOPY
    COENE, W
    JANSSEN, G
    DEBEECK, MO
    VANDYCK, D
    [J]. PHYSICAL REVIEW LETTERS, 1992, 69 (26) : 3743 - 3746
  • [3] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE
    COWLEY, JM
    [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &
  • [4] JENKINS WK, 1977, IOP C P, V36
  • [5] INCOHERENT IMAGING OF THIN SPECIMENS USING COHERENTLY SCATTERED ELECTRONS
    JESSON, DE
    PENNYCOOK, SJ
    [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1993, 441 (1912): : 261 - 281
  • [6] SUPERRESOLUTION BY APERTURE SYNTHESIS - TILT SERIES RECONSTRUCTION IN CTEM
    KIRKLAND, AI
    SAXTON, WO
    CHAU, KL
    TSUNO, K
    KAWASAKI, M
    [J]. ULTRAMICROSCOPY, 1995, 57 (04) : 355 - 374
  • [7] KRIVANEK OL, 1997, IOP C P, V153
  • [8] Mobus G, 1997, J ELECTRON MICROSC, V46, P381, DOI 10.1093/oxfordjournals.jmicro.a023534
  • [9] Accurate structure determination from image reconstruction in ADF STEM
    Nellist, PD
    Pennycook, SJ
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1998, 190 : 159 - 170
  • [10] RESOLUTION BEYOND THE INFORMATION LIMIT IN TRANSMISSION ELECTRON-MICROSCOPY
    NELLIST, PD
    MCCALLUM, BC
    RODENBURG, JM
    [J]. NATURE, 1995, 374 (6523) : 630 - 632
123