Nonlinear thermal characteristics of silicon carbide devices

被引：10
|
作者：
Janke, Wlodzimierz [1 ]
Hapka, Aneta [1 ]
机构：
[1] Tech Univ Koszalin, Dept Elect & Comp Sci, PL-75453 Koszalin, Poland
来源：
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS | 2011年 / 176卷 / 04期
关键词：
Silicon carbide; Schottky diodes; Thermal transients;
D O I：
10.1016/j.mseb.2010.06.021
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In the paper, the dynamic nonlinear model of SiC devices is proposed, where the dependencies of the thermal parameters on the temperature are included. The proposed model is applicable and useful in the simulations of electro-thermal transients in the devices working with high power density and in the wide range of temperature. (C) 2010 Elsevier By. All rights reserved.
引用
收藏
页码：289 / 292
页数：4
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