Comprehensive Data Collection Device for Plasma Equipment Intelligence Studies

被引:2
作者
Kim, Yong-Hyun [1 ,2 ]
Cho, Ji-Ho [2 ]
Kim, Jong-Sik [1 ,2 ]
Park, Jong-Bae [1 ,2 ]
Kim, Dae-Chul [1 ,2 ]
Kim, Young-Woo [1 ,2 ]
机构
[1] Korea Inst Fus Energy, Inst Plasma Technol, Fundamental Technol Res Div, Gunsan Si 54004, South Korea
[2] Korea Inst Fus Energy, Plasma EI Convergence Res Ctr, Gunsan Si 54004, South Korea
关键词
plasma parameters; plasma diagnostics; non-invasive method; regression; data collection; VIRTUAL METROLOGY; DENSITY;
D O I
10.3390/coatings11091025
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, various diagnostic tools were constructed and plasma factors measured to evaluate the intelligence of plasma process equipment. We used an ICP (Inductively Coupled Plasma) reactor with a radio frequency (RF) power of 13.56 MHz, a power of 400 to 800 W, and a pressure of 10 to 30 mTorr. Plasma parameters such as electron density (n(e)), electron temperature (T-e), plasma potential (V-p), and floating potential (V-f) were measured using several instruments (VI probe and mass/energy analyzer, etc.) and subsequently analyzed. Regression analysis was performed to correlate the measured data with the plasma parameters. As a result, the plasma density (n(e)) and temperature (T-e) were observed to be in good agreement with the non-invasive measurement results. In particular, the VI probes were highly correlated with almost all the measured plasma parameters. Therefore, the results of this study provide a basis for the estimation of plasma parameters using non-invasive measurement techniques.
引用
收藏
页数:11
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