Effect of Temperature to The Structure of Silicon Nanowires Growth by Metal-Assisted Chemical Etching

被引:0
|
作者
Omar, H. [1 ]
Salifairus, M. J. [2 ,3 ]
Alrokayan, Salman A. H. [2 ,3 ]
Khan, Haseeb A. [2 ,3 ]
Jani, A. M. M. [2 ,3 ]
Rusop, M. [2 ,3 ]
Abdullah, S. [2 ,3 ]
机构
[1] Univ Teknol MARA UiTM, Fac Sci Appl, Inst Sci, NANOScitech Ctr, Shah Alam, Malaysia
[2] Univ Teknol MARA UiTM, Fac Elect Engn, Fac Sci Appl, Shah Alam, Malaysia
[3] King Saud Univ, Coll Sci, Dept Biochem, Res Chair Biomed Applicat Nanomat, Riyadh 11454, Saudi Arabia
来源
2015 IEEE STUDENT CONFERENCE ON RESEARCH AND DEVELOPMENT (SCORED) | 2015年
关键词
silicon nanowires; temperature; silver nanoparticle; field emission scanning electron microscopy;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A simple and low cost method to produce well aligned silicon nanowires at large areas using metal assisted chemical etching at various temperature were presented. The high aspect ratio structure of silicon nanowires growth by anisotropic wet etching method was observed. Prior to the etching, the formation of silicon nanowires was by metal assisted chemical etching (MACE) in solution containing hydrofluoric acid and hydrogen peroxide in Teflon vessel. The silver nanoparticle was deposited on substrate by immersion in hydrofluoric acid and silver nitrate solution for sixty second. The silicon nanowires were grown in different temperature which are room temperature, 30 degrees C, 40 degrees C, 65 degrees C and 80 degrees C. The effect of increasing temperature to the formation of silicon nanowires was studied. The morphological properties of silicon nanowires were investigated using field emission scanning electron microscopy (FESEM) and Energy Dispersive X-Ray Spectroscopy (EDX). The optical properties of silicon nanowires were investigated using Uv-Vis spectroscopy.
引用
收藏
页码:649 / 652
页数:4
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