An analytical surrounding gate MOSFET model

被引:37
作者
Jang, SL [1 ]
Liu, SS [1 ]
机构
[1] Natl Taiwan Inst Technol, Dept Elect Engn, Taipei 106, Taiwan
关键词
D O I
10.1016/S0038-1101(97)00243-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we present a complete and analytical drain current model for surrounding gate MOSFETs. The model was developed using a quasi-two-dimensional cylindrical form of the Poisson equation and based on the drift-diffusion equation. The model applicable for digital/analog circuit simulation contains the following advanced features: precise description of the subthreshold, near threshold and above-threshold regions of operation by one single expression; single-piece drain current equation smoothly continuous from the linear region to the saturation region; considering the source/drain resistance; inclusion of important short channel effects such as velocity saturation, drain-induced barrier lowering and channel length modulation. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:721 / 726
页数:6
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