Energy-dependent fragmentation of polystyrene molecule using size-selected Ar gas cluster ion beam projectile

被引：31
作者：
Moritani, Kousuke [1 ]
Mukai, Gen [1 ]
Hashinokuchi, Michihiro [1 ]
Mochiji, Kozo [1 ]
机构：
[1] Univ Hyogo, Dept Mech & Syst Engn, Grad Sch Engn, Himeji, Hyogo 6712201, Japan
来源：
SURFACE AND INTERFACE ANALYSIS | 2011年 / 43卷 / 1-2期
基金：
日本科学技术振兴机构;
关键词：
TOF-SIMS; gas cluster ion beam; polymer; surface analysis; MASS-SPECTROMETRY; POLYMER MATERIALS; SIMS; SURFACES;
D O I：
10.1002/sia.3551
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
A size-selected Ar gas cluster ion beam (GCIB) was applied to the SIMS of a polystyrene thin film. The size of Ar cluster ions are selected between 5000 to 500 atoms at an acceleration voltage of 5 and 10 kV using time-of-flight technique. Under this condition, the kinetic energy per constituent atom (E-atom) of the GCIB projectile was estimated to be 1 similar to 20 eV. The E-atom dependence of secondary ion yield of fragment species of polystyrene can be essentially classified into three types which are attributable to the relationship between the E-atom and the dissociation energy of the specified bonding site of the molecule. These results indicate that the site-specific bond breaking of molecules could be possible by adjusting the E-atom of size-selected GCIB. Copyright (C) 2010 John Wiley & Sons, Ltd.
引用
收藏
页码：241 / 244
页数：4
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