In this communication, we report on electrical and electro-optical characterizations of InAs/GaSb Type-II superlattice (T2SL) LWIR photodetector, showing cut-off wavelengths at 11 mu m at 77K. The devices, made of barrier structures in XBp configuration, were grown by molecular beam epitaxy (MBE) on GaSb substrate. Experimental measurements on samples were made by photoresponse spectra, by capacitance-voltage (C-V) and dark current-voltage (I-V) characteristics performed as a function of temperature.
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Connelly, Blair C.
Metcalfe, Grace D.
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, Grace D.
Shen, Hongen
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, Hongen
Wraback, Michael
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Connelly, Blair C.
Metcalfe, Grace D.
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h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, Grace D.
Shen, Hongen
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, Hongen
Wraback, Michael
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA