A new scheme for Imaging on-chip dry DNA spots using optical/potential dual-image complementary metal oxide semiconductor sensor

被引：5

作者：

Tokuda, Takashi ^{[1
]}

Kadowaki, Issei ^{[1
]}

Kagawa, Keiichiro ^{[1
]}

Nunoshita, Masahiro ^{[1
]}

Ohta, Jun ^{[1
]}

机构：

[1] Nara Inst Sci & Technol, Grad Sch Mat Sci, Ikoma, Nara 6300192, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 4B期

关键词：

CMOS image sensor; DNA microarray; on-chip potential image;

D O I：

10.1143/JJAP.46.2806

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new scheme to image on-chip DNA spots using an optical /potential dual-image complementary metal oxide semiconductor (CMOS) sensor was proposed and demonstrated. Dry DNA spots have been successfully imaged without using an off-chip reference electrode. The structure of our dual-image sensor plays an essential role in the measurement method. The sensor was revealed to be capable of sensing the dielectric properties of materials placed on the sensor surface. The present measurement scheme is expected to be a powerful method for sensing dry on-chip biomolecular spots, with better compatibility with conventional slide-glass-based microarray technologies.

引用

页码：2806 / 2810

页数：5

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