Analysis of Dynamic Models of STT-MRAM

被引:0
|
作者
Mathew, Betty Rachel [1 ]
Mangai, N. M. Siva [1 ]
机构
[1] Karunya Inst Technol & Sci, Dept Elect Sci, Coimbatore, Tamil Nadu, India
关键词
Memory; Magnetic Tunnel Junction (MTJ); Spin Transfer Torque (STT); Magnetoresistive Random Access Memory (MRAM); Tunnelling Magnetoresistance (TMR) ratio; Dynamic model; LOW-POWER;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
STT-MRAM has the potential to become a universal memory owing to many advantages it has as compared to the existing memory technologies. Several models, both static as well as dynamic models have been developed amongst which dynamic models have been known to display more accurate behaviour. In this paper, we have chosen two such dynamic models already developed and available and observed and verified their transient response.
引用
收藏
页码:259 / 262
页数:4
相关论文
共 50 条
  • [21] Dynamic Behavior Predictions for Fast and Efficient Hybrid STT-MRAM Caches
    Sayed, Nour
    Mao, Longfei
    Tahoori, Mehdi B.
    ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2021, 17 (01)
  • [22] Experimental analysis on stochastic behavior of preswitching time in STT-MRAM
    Yazigy, N.
    Postel-Pellerin, J.
    Della Marca, V.
    Terziyan, K.
    Nadifi, S.
    Sousa, R. C.
    Canet, P.
    Di Pendina, G.
    MICROELECTRONICS RELIABILITY, 2022, 138
  • [23] Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
    Wu, Lizhou
    Rao, Siddharth
    Taouil, Mottaqiallah
    Marinissen, Erik Jan
    Kar, Gouri Sankar
    Hamdioui, Said
    2021 IEEE INTERNATIONAL TEST CONFERENCE (ITC 2021), 2021, : 143 - 152
  • [24] Recent progresses in STT-MRAM and SOT-MRAM for next generation MRAM
    Endoh, Tetsuo
    Honjo, Hiroaki
    Nishioka, Koichi
    Ikeda, Shoji
    2020 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, 2020,
  • [25] A Study on Practically Unlimited Endurance of STT-MRAM
    Kan, Jimmy J.
    Park, Chando
    Ching, Chi
    Ahn, Jaesoo
    Xie, Yuan
    Pakala, Mahendra
    Kang, Seung H.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (09) : 3639 - 3646
  • [26] Test Challenges In Embedded STT-MRAM Arrays
    Yoon, Insik
    Raychowdhury, Arijit
    PROCEEDINGS OF THE EIGHTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2017, : 35 - 38
  • [27] Innovative approaches to the invisible defect on STT-MRAM
    Lee, Gwang Wook
    Ok, Euna
    Heo, Suhaeng
    Jeong, Daeeun
    Lee, Joonmyoung
    Shim, Sunnu
    Kim, Wonse
    Han, Yongwoon
    Choi, Hunseong
    Kim, Jae Hyun
    Cho, Seongjun
    Won, Seokjun
    Kim, Jinsung
    MICROELECTRONICS RELIABILITY, 2019, 100
  • [28] RAM and TCAM Designs by Using STT-MRAM
    Yan, Bonan
    Li, Zheng
    Chen, Yiran
    Li, Hai
    2016 16TH NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM (NVMTS), 2016,
  • [29] Reliability of STT-MRAM for various embedded applications
    Han, S. H.
    Lee, J. H.
    Suh, K. S.
    Nam, K. T.
    Jeong, D. E.
    Oh, S. C.
    Hwang, S. H.
    Ji, Y.
    Lee, K.
    Song, Y. J.
    Hong, Y. G.
    Jeong, G. T.
    2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,
  • [30] STT-MRAM with double magnetic tunnel junctions
    Hu, G.
    Lee, J. H.
    Nowak, J. J.
    Sun, J. Z.
    Harms, J.
    Annunziata, A.
    Brown, S.
    Chen, W.
    Kim, Y. H.
    Lauer, G.
    Liu, L.
    Marchack, N.
    Murthy, S.
    O'Sullivan, E. J.
    Park, J. H.
    Reuter, M.
    Robertazzi, R. P.
    Trouilloud, P. L.
    Zhu, Y.
    Worledge, D. C.
    2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2015,