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- [21] Dynamic Behavior Predictions for Fast and Efficient Hybrid STT-MRAM CachesACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS, 2021, 17 (01)Sayed, Nour论文数: 0 引用数: 0 h-index: 0机构: Karlsruhe Inst Technol KIT, Chair Dependable Nano Comp, Karlsruhe, Germany Karlsruhe Inst Technol KIT, Chair Dependable Nano Comp, Karlsruhe, GermanyMao, Longfei论文数: 0 引用数: 0 h-index: 0机构: Karlsruhe Inst Technol KIT, Karlsruhe, Germany Karlsruhe Inst Technol KIT, Chair Dependable Nano Comp, Karlsruhe, GermanyTahoori, Mehdi B.论文数: 0 引用数: 0 h-index: 0机构: Karlsruhe Inst Technol KIT, Chair Dependable Nano Comp, Karlsruhe, Germany Karlsruhe Inst Technol KIT, Chair Dependable Nano Comp, Karlsruhe, Germany
- [22] Experimental analysis on stochastic behavior of preswitching time in STT-MRAMMICROELECTRONICS RELIABILITY, 2022, 138Yazigy, N.论文数: 0 引用数: 0 h-index: 0机构: Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FrancePostel-Pellerin, J.论文数: 0 引用数: 0 h-index: 0机构: Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FranceDella Marca, V.论文数: 0 引用数: 0 h-index: 0机构: Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FranceTerziyan, K.论文数: 0 引用数: 0 h-index: 0机构: Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FranceNadifi, S.论文数: 0 引用数: 0 h-index: 0机构: Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FranceSousa, R. C.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, SPINTEC, CNRS, CEA SPINTEC, F-38000 Grenoble, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FranceCanet, P.论文数: 0 引用数: 0 h-index: 0机构: Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, FranceDi Pendina, G.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, SPINTEC, CNRS, CEA SPINTEC, F-38000 Grenoble, France Aix Marseille Univ, CNRS, IM2NP, F-13451 Marseille, France
- [23] Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions2021 IEEE INTERNATIONAL TEST CONFERENCE (ITC 2021), 2021, : 143 - 152Wu, Lizhou论文数: 0 引用数: 0 h-index: 0机构: TUDelft, Delft, Netherlands TUDelft, Delft, NetherlandsRao, Siddharth论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium TUDelft, Delft, NetherlandsTaouil, Mottaqiallah论文数: 0 引用数: 0 h-index: 0机构: TUDelft, Delft, Netherlands CognitiveIC, Delft, Netherlands TUDelft, Delft, NetherlandsMarinissen, Erik Jan论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium TUDelft, Delft, NetherlandsKar, Gouri Sankar论文数: 0 引用数: 0 h-index: 0机构: IMEC, Leuven, Belgium TUDelft, Delft, NetherlandsHamdioui, Said论文数: 0 引用数: 0 h-index: 0机构: TUDelft, Delft, Netherlands CognitiveIC, Delft, Netherlands TUDelft, Delft, Netherlands
- [24] Recent progresses in STT-MRAM and SOT-MRAM for next generation MRAM2020 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, 2020,Endoh, Tetsuo论文数: 0 引用数: 0 h-index: 0机构: Tohoku Univ, Ctr Innovat Integrated Elect Syst, Sendai, Miyagi 9800845, Japan Tohoku Univ, Ctr Sci & Innovat Spintron, Sendai, Miyagi, Japan Tohoku Univ, Res Inst Elect Commun, Sendai, Miyagi, Japan Tohoku Univ, Ctr Spintron Res Network, Sendai, Miyagi, Japan Tohoku Univ, Grad Sch Engn, Sendai, Miyagi, Japan Tohoku Univ, Ctr Innovat Integrated Elect Syst, Sendai, Miyagi 9800845, JapanHonjo, Hiroaki论文数: 0 引用数: 0 h-index: 0机构: Tohoku Univ, Ctr Innovat Integrated Elect Syst, Sendai, Miyagi 9800845, Japan Tohoku Univ, Ctr Innovat Integrated Elect Syst, Sendai, Miyagi 9800845, Japan论文数: 引用数: h-index:机构:Ikeda, Shoji论文数: 0 引用数: 0 h-index: 0机构: Tohoku Univ, Ctr Innovat Integrated Elect Syst, Sendai, Miyagi 9800845, Japan Tohoku Univ, Ctr Sci & Innovat Spintron, Sendai, Miyagi, Japan Tohoku Univ, Res Inst Elect Commun, Sendai, Miyagi, Japan Tohoku Univ, Ctr Spintron Res Network, Sendai, Miyagi, Japan Tohoku Univ, Ctr Innovat Integrated Elect Syst, Sendai, Miyagi 9800845, Japan
- [25] A Study on Practically Unlimited Endurance of STT-MRAMIEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (09) : 3639 - 3646Kan, Jimmy J.论文数: 0 引用数: 0 h-index: 0机构: Qualcomm Technol Inc, San Diego, CA 92121 USA Qualcomm Technol Inc, San Diego, CA 92121 USAPark, Chando论文数: 0 引用数: 0 h-index: 0机构: Qualcomm Technol Inc, San Diego, CA 92121 USA Qualcomm Technol Inc, San Diego, CA 92121 USAChing, Chi论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Sunnyvale, CA 94085 USA Qualcomm Technol Inc, San Diego, CA 92121 USAAhn, Jaesoo论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Sunnyvale, CA 94085 USA Qualcomm Technol Inc, San Diego, CA 92121 USAXie, Yuan论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93111 USA Qualcomm Technol Inc, San Diego, CA 92121 USAPakala, Mahendra论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, Sunnyvale, CA 94085 USA Qualcomm Technol Inc, San Diego, CA 92121 USAKang, Seung H.论文数: 0 引用数: 0 h-index: 0机构: Qualcomm Technol Inc, San Diego, CA 92121 USA Qualcomm Technol Inc, San Diego, CA 92121 USA
- [26] Test Challenges In Embedded STT-MRAM ArraysPROCEEDINGS OF THE EIGHTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2017, : 35 - 38Yoon, Insik论文数: 0 引用数: 0 h-index: 0机构: Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USARaychowdhury, Arijit论文数: 0 引用数: 0 h-index: 0机构: Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
- [27] Innovative approaches to the invisible defect on STT-MRAMMICROELECTRONICS RELIABILITY, 2019, 100Lee, Gwang Wook论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaOk, Euna论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaHeo, Suhaeng论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaJeong, Daeeun论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, R&D Ctr, 1 Samsungjeonja Ro, Hwasung 18448, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaLee, Joonmyoung论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, R&D Ctr, 1 Samsungjeonja Ro, Hwasung 18448, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaShim, Sunnu论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaKim, Wonse论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaHan, Yongwoon论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaChoi, Hunseong论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaKim, Jae Hyun论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaCho, Seongjun论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaWon, Seokjun论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South KoreaKim, Jinsung论文数: 0 引用数: 0 h-index: 0机构: Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea Samsung Foundry, 1 Samsung Ro, Yongin 17113, Gyeonggi Do, South Korea
- [28] RAM and TCAM Designs by Using STT-MRAM2016 16TH NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM (NVMTS), 2016,Yan, Bonan论文数: 0 引用数: 0 h-index: 0机构: Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USALi, Zheng论文数: 0 引用数: 0 h-index: 0机构: Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USAChen, Yiran论文数: 0 引用数: 0 h-index: 0机构: Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USALi, Hai论文数: 0 引用数: 0 h-index: 0机构: Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA
- [29] Reliability of STT-MRAM for various embedded applications2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2021,Han, S. H.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaLee, J. H.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect, R&D Ctr, Hwasung, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaSuh, K. S.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaNam, K. T.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaJeong, D. E.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect, R&D Ctr, Hwasung, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaOh, S. C.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect, R&D Ctr, Hwasung, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaHwang, S. H.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaJi, Y.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaLee, K.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect, R&D Ctr, Hwasung, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaSong, Y. J.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect, R&D Ctr, Hwasung, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaHong, Y. G.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South KoreaJeong, G. T.论文数: 0 引用数: 0 h-index: 0机构: Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea Samsung Elect Co, Foundry Business, San 24 Nongseo Dong, Yongin 446711, Gyeonggi Do, South Korea
- [30] STT-MRAM with double magnetic tunnel junctions2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2015,Hu, G.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USALee, J. H.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USANowak, J. J.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USASun, J. Z.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAHarms, J.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAAnnunziata, A.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USABrown, S.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAChen, W.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAKim, Y. H.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USALauer, G.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USALiu, L.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAMarchack, N.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAMurthy, S.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAO'Sullivan, E. J.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAPark, J. H.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAReuter, M.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USARobertazzi, R. P.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USATrouilloud, P. L.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAZhu, Y.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USAWorledge, D. C.论文数: 0 引用数: 0 h-index: 0机构: IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Samsung MRAM Alliance, Yorktown Hts, NY USA IBM TJ Watson Res Ctr, IBM Micron MRAM Alliance, Yorktown Hts, NY USA