DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS

被引：10

作者：

Velichko, A. ^{[1
]}

Wilcox, P. D. ^{[1
]}

机构：

[1] Univ Bristol, Dept Mech Engn, Bristol BS8 1TR, Avon, England

来源：

REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B | 2011年 / 1335卷

基金：

英国工程与自然科学研究理事会;

关键词：

2D Array; Array Layout; Imaging; ALGORITHM;

D O I：

10.1063/1.3591934

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

2D arrays are able to 'view' a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.

引用

页码：835 / 842

页数：8

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