Dynamic survey of architectural heritage by high-speed microwave interferometry

被引:32
作者
Pieraccini, M [1 ]
Fratini, M
Parrini, F
Pinelli, G
Atzeni, C
机构
[1] Univ Florence, Dept Elect & Telecommun, I-50139 Florence, Italy
[2] IDS SpA, I-56010 Pisa, Italy
关键词
cultural heritage; interferometry; microwave sensor; radar; remote sensing; vibration measurement;
D O I
10.1109/LGRS.2004.840616
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
The authors propose the use of a high-speed interferometric radar for remotely measuring both transient displacements and steady-state vibrations of architectural heritage structures in order to test their stability conditions. Demonstrative results of application of the technique to a prominent cultural heritage artwork, the tower of Giotto in Florence, Italy, are reported.
引用
收藏
页码:28 / 30
页数:3
相关论文
共 6 条
[1]   Microwave interferometers for non-contact vibration measurements on large structures [J].
Farrar, CR ;
Darling, TW ;
Migliori, A ;
Baker, WE .
MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 1999, 13 (02) :241-253
[2]   Review of NDT methods in the assessment of concrete and masonry structures [J].
McCann, DM ;
Forde, MC .
NDT & E INTERNATIONAL, 2001, 34 (02) :71-84
[3]   Remote sensing of building structural displacements using a microwave interferometer with imaging capability [J].
Pieraccini, M ;
Luzi, G ;
Mecatti, D ;
Fratini, M ;
Noferini, L ;
Carissimi, L ;
Franchioni, G ;
Atzeni, C .
NDT & E INTERNATIONAL, 2004, 37 (07) :545-550
[4]   High-speed CW step-frequency coherent radar for dynamic monitoring of civil engineering structures [J].
Pieraccini, M ;
Fratini, M ;
Parrini, E ;
Macaluso, G ;
Atzeni, C .
ELECTRONICS LETTERS, 2004, 40 (14) :907-908
[5]   Interferometric radar for remote monitoring of building deformations [J].
Pieraccini, M ;
Tarchi, D ;
Rudolf, H ;
Leva, D ;
Luzi, G ;
Atzeni, C .
ELECTRONICS LETTERS, 2000, 36 (06) :569-570
[6]   Microwave techniques for measurement of large-structure vibration [J].
Pieraccini, M ;
Luzi, G ;
Mecatti, D ;
Gusella, V ;
Atzeni, C .
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2003, 37 (03) :216-218