Residual stress of multilayer ceramic capacitors (MLCCs)

被引：4

作者：

Nakano, Y

Nomura, T

Takenaka, T

机构：

[1] TDK Corp, Chiba 2868588, Japan

[2] Sci Univ Tokyo, Noda, Chiba 2780022, Japan

来源：

ELECTROCERAMICS IN JAPAN VI | 2003年 / 248卷

关键词：

multilayer ceramic capacitor; residual stress; anisotropy; dielectric constant; capacitance change;

D O I：

10.1201/NOE9058095565.ch21

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The residual stress of MLCCs has been studied. The compressive residual stress at the surface of MLCCs was shown by X-ray diffraction. The stress increased with the number of dielectric layers in MLCCs. The dielectric constant at room temperature increased with the number of layers in MLCCs. Moreover, the external compressive stress showed a deleterious effect on the dielectric constant. Therefore, it is supposed that the residual stress caused the increase of the dielectric constant with the number of layers in MLCCs.

引用

页码：179 / 182

页数：4

共 6 条

[1] Multilayer capacitor margin stresses and electrode to dielectric thickness calculations [J].