Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy

被引：21

作者：

Lee, CH ^{[1
]}

Chiang, HY ^{[1
]}

Mong, HY ^{[1
]}

机构：

[1] Acad Sinica, Inst Appl Sci & Engn Res, Taipei 115, Taiwan

来源：

OPTICS LETTERS | 2003年 / 28卷 / 19期

关键词：

D O I：

10.1364/OL.28.001772

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Using the nanometer depth sensitivity of differential confocal microscopy, we detect surface features of lateral dimensions smaller than the diffraction limit without fluorescence labeling. The lateral resolution of the topographic images is further enhanced by a maximum-likelihood estimation algorithm. Based on the comparison of signal and noise at high spatial frequency, we estimate the best lateral resolution of the enhanced images to be 0.15lambda.. In addition, on composite samples this technique can simultaneously display sub-diffraction-limit topographic features and reflectivity heterogeneity. (C) 2003 Optical Society of America.

引用

页码：1772 / 1774

页数：3

共 15 条

[1] SUPERRESOLUTION 3-DIMENSIONAL IMAGES OF FLUORESCENCE IN CELLS WITH MINIMAL LIGHT EXPOSURE [J].

CARRINGTON, WA ;

LYNCH, RM ;

MOORE, EDW ;

ISENBERG, G ;

FOGARTY, KE ;

FREDRIC, FS .

SCIENCE, 1995, 268 (5216) :1483-1487

[2] Superresolution and convergence properties of the expectation-maximization algorithm for maximum-likelihood deconvolution of incoherent images [J].

Conchello, JA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (10) :2609-2619

[3]

CSISZAR I, 1991, ANN STAT, V19, P2033

[4] Focal spots of size λ/23 open up far-field florescence microscopy at 33 nm axial resolution -: art. no. 163901 [J].

Dyba, M ;

Hell, SW .

PHYSICAL REVIEW LETTERS, 2002, 88 (16) :4-163901

[5] True optical resolution beyond the Rayleigh limit achieved by standing wave illumination [J].

Frohn, JT ;

Knapp, HF ;

Stemmer, A .

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2000, 97 (13) :7232-7236

[6] Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy [J].

Gustafsson, MGL .

JOURNAL OF MICROSCOPY, 2000, 198 (02) :82-87

[7] Subdiffraction resolution in far-field fluorescence microscopy [J].

Klar, TA ;

Hell, SW .

OPTICS LETTERS, 1999, 24 (14) :954-956

[8] Noninterferometric differential confocal microscopy with 2-nm depth resolution [J].

Lee, CH ;

Wang, JP .

OPTICS COMMUNICATIONS, 1997, 135 (4-6) :233-237

[9] Fast maximum-likelihood image-restoration algorithms for three-dimensional fluorescence microscopy [J].

Markham, J ;

Conchello, JA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2001, 18 (05) :1062-1071

[10] Potential of confocal microscopes to resolve in the 50-100 nm range [J].

Schrader, M ;

Hai, SW ;

vanderVoort, HTM .

APPLIED PHYSICS LETTERS, 1996, 69 (24) :3644-3646

← 1 2 →