Ultra high density data storage on phase change materials with electrical micro-tips

被引：28

作者：

Saluel, D ^{[1
]}

Daval, J ^{[1
]}

Béchevet, B ^{[1
]}

Germain, C ^{[1
]}

Valon, B ^{[1
]}

机构：

[1] CEA Grenoble, LETI, DMITEC, SCPI,MEO, F-38054 Grenoble 09, France

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1999年 / 193卷 / 1-3期

关键词：

ultrahigh density; data storage; phase change materials; STM; AFM;

D O I：

10.1016/S0304-8853(98)00480-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have studied the feasibility of a recording process using electrical micro-tips on phase change materials. Calculations and experiments demonstrate that the tunnelling probe is a sufficient heater source for this application. Difficulties remain in the control of the writing current during pulse application and in the detection of resistivity change with the tunnelling probe. WORM memory was carried out with a data density up to 10 Gbit/in(2). Solution for reversible storage on phase change materials are proposed. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：488 / 491

页数：4

共 10 条

[1] Low-stiffness silicon cantilevers for thermal writing and piezoresistive readback with the atomic force microscope [J].

Chui, BW ;

Stowe, TD ;

Kenny, TW ;

Mamin, HJ ;

Terris, BD ;

Rugar, D .

APPLIED PHYSICS LETTERS, 1996, 69 (18) :2767-2769

[2] POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE [J].

EIGLER, DM ;

SCHWEIZER, EK .

NATURE, 1990, 344 (6266) :524-526

[3] Electron emission in intense electric fields [J].

Fowler, RH ;

Nordheim, L .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1928, 119 (781) :173-181

[4] Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode [J].

Hosaka, S ;

Shintani, T ;

Miyamoto, M ;

Hirotsune, A ;

Terao, M ;

Yoshida, M ;

Fujita, K ;

Kammer, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (1B) :443-447

[5] NANOMETER-SCALE RECORDING ON CHALCOGENIDE FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

KADO, H ;

TOHDA, T .

APPLIED PHYSICS LETTERS, 1995, 66 (22) :2961-2962

[6] WRITING NANOMETER-SCALE SYMBOLS IN GOLD USING THE SCANNING TUNNELING MICROSCOPE [J].

LI, YZ ;

VAZQUEZ, L ;

PINER, R ;

ANDRES, RP ;

REIFENBERGER, R .

APPLIED PHYSICS LETTERS, 1989, 54 (15) :1424-1426

[7] Field emission characteristics of the scanning tunneling microscope for nanolithography [J].

Mayer, TM ;

Adams, DP ;

Marder, BM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (04) :2438-2444

[8]

OHNO E, 1994, Patent No. 5289453

[9]

RUSSEL AM, 1961, J APPL PHYS, V33, P970

[10] Nanometer-scale recording, erasing, and reproducing using scanning tunneling microscopy [J].

Sato, A ;

Momose, S ;

Tsukamoto, Y .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06) :2832-2836

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