Current response of graded-gap AlxGa1-xAs X-ray detector is experimentally investigated. An increase in sensitivity of the detectors is achieved using a charge avalanche multiplication effect in a narrow region of a p-AlxGa1-xAs/n-GaAs heterojunction. The graded-gap AlxGa1-xAs X-ray detector with charge avalanche Multiplication has been developed. The sensitivity of this new type detector at a bias voltage U = 1.5 V reaches 2.5 A/W. That is fifty times higher in comparison with the sensitivity of the detector without charge multiplication (U = 0).