Solution-Processed Complementary Resistive Switching Arrays for Associative Memory

被引:18
作者
Smith, Jeremy [1 ]
Chung, Seungjun [1 ,2 ]
Jang, Jaewon [1 ,3 ]
Biaou, Carlos [1 ]
Subramanian, Vivek [1 ]
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] Seoul Natl Univ, Dept Phys & Astron, Seoul 08826, South Korea
[3] Kyungpook Natl Univ, Sch Elect Engn, Daegu 41566, South Korea
关键词
Associative memory; inkjet printing; resistive RAM (RRAM); thin-film devices; zirconium oxide; FIELD-EFFECT TRANSISTORS; NANOPARTICLES; VOLTAGE; RRAM;
D O I
10.1109/TED.2017.2732920
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Complementary resistive switches (CRS) based on back-to-back nanofilamentary resistive RAM devices have been fabricated by an all-solution-processed method, employing inkjet-printed Ag and Au contacts and a spin-coated sol-gel zirconium oxide dielectric layer. The devices demonstrate electrical switching behavior below 3 V, stable on-state windows, reasonable cycle lifetimes, and can be implemented in 2x2 memory arrays with no crosstalk during addressing. For reliable operation and high yields of the CRS devices, printing and annealing processes were carefully optimized to eliminate the coffeering effect on the bottom electrode, and produce a pin-hole free dielectric. The arrays are fully pulse programmable and are able to retain their state for > 10(4) s. Additionally, the arrays can be operated as associative or content addressable, memory for pattern matching applications, which is demonstrated through a basic hamming distance mapping measurement for different stored data states.
引用
收藏
页码:4310 / 4316
页数:7
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