Formation of intermetallic compounds between liquid Sn and various CuNix metallizations

被引:83
作者
Vuorinen, V. [1 ]
Yu, H. [1 ]
Laurila, T. [1 ]
Kivilahti, J. K. [1 ]
机构
[1] Helsinki Univ Technol, Lab Elect Prod Technol, Helsinki 02015, Finland
关键词
intermetallic formation; soldering; lead-free; solidification; kinetics; metastable solubility; reliability; phase diagram;
D O I
10.1007/s11664-008-0411-x
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Interfacial reactions between liquid Sn and various Cu-Ni alloy metallizations as well as the subsequent phase transformations during the cooling were investigated with an emphasis on the microstructures of the reaction zones. It was found that the extent of the microstructurally complex reaction layer (during reflow at 240 degrees C) does not depend linearly on the Ni content of the alloy metallization. On the contrary, when Cu is alloyed with Ni, the rate of thickness change of the total reaction layer first increases and reaches a maximum at a composition of about 10 at.% Ni. The reaction layer is composed of a relatively uniform continuous (Cu,Ni)(6)Sn-5 reaction layer (a uniphase layer) next to the NiCu metallizations and is followed by the two-phase solidification structures between the single-phase layer and Sn matrix. The thickness of the two-phase layer, where the intermetallic tubes and fibers have grown from the continuous interfacial (Cu,Ni)(6)Sn-5 layer, varies with the Ni-to-Cu ratio of the alloy metallization. In order to explain the formation mechanism of the reaction layers and their observed kinetics, the phase equilibria in the Sn-rich side of the SnCuNi system at 240 degrees C were evaluated thermodynamically utilizing the available data, and the results of the Sn/CuxNi1-x diffusion couple experiments. With the help of the assessed data, one can also evaluate the minimum Cu content of Sn-(Ag)-Cu solder, at which (Ni,Cu)(3)Sn-4 transforms into (Cu,Ni)(6)Sn-5, as a function of temperature and the composition of the liquid solders.
引用
收藏
页码:792 / 805
页数:14
相关论文
共 43 条
[1]   Effect of 0.5 wt % Cu in Sn-3.5%Ag solder on the interfacial reaction with Au/Ni metallization [J].
Alam, MO ;
Chan, YC ;
Tu, KN .
CHEMISTRY OF MATERIALS, 2003, 15 (23) :4340-4342
[2]   RAPID FORMATION OF INTERMETALLIC COMPOUNDS BY INTERDIFFUSION IN THE CU-SN AND NI-SN SYSTEMS [J].
BADER, S ;
GUST, W ;
HIEBER, H .
ACTA METALLURGICA ET MATERIALIA, 1995, 43 (01) :329-337
[3]   KIRKENDALL EFFECT STUDIES IN COPPER-TIN DIFFUSION COUPLES [J].
BHEDWAR, HC ;
BALASUBRAMANIAN, V ;
KULKARNI, SD ;
RAY, KK .
SCRIPTA METALLURGICA, 1972, 6 (10) :919-+
[4]   Interfacial reactions in the Sn-(Cu)/Ni, Sn-(Ni)/Cu, and Sn/(Cu,Ni) systems [J].
Chen, SW ;
Wu, SH ;
Lee, SW .
JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (11) :1188-1194
[5]   Effect of Cu concentration on the interfacial reactions between Ni and Sn-Cu solders [J].
Chen, WT ;
Ho, CE ;
Kao, CR .
JOURNAL OF MATERIALS RESEARCH, 2002, 17 (02) :263-266
[6]  
Darken LS., 1953, PHYS CHEM METALS
[7]   SGTE DATA FOR PURE ELEMENTS [J].
DINSDALE, AT .
CALPHAD-COMPUTER COUPLING OF PHASE DIAGRAMS AND THERMOCHEMISTRY, 1991, 15 (04) :317-425
[8]   Nucleation kinetics of Cu6Sn5 by reaction of molten tin with a copper substrate [J].
Gagliano, RA ;
Ghosh, G ;
Fine, ME .
JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (11) :1195-1202
[9]   Reactive interdiffusion between a lead-free solder and Ti/Ni/Ag thin-film metallizations [J].
Ghosh, G .
JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (03) :229-240
[10]   Dissolution and interfacial reactions of thin-film Ti/Ni/Ag metallizations in solder joints [J].
Ghosh, G .
ACTA MATERIALIA, 2001, 49 (14) :2609-2624