Phase unwrapping for dual-beam electronic speckle pattern interferometry: Method

被引：5
|
作者：
Yoshida, S
Suprapedi
Widiastuti, R
Marincan
Septriyanti
Julinda
Faisal, A
Kusnowo, A
机构：
[1] The Research and Development Center for Applied Physics, Tangerang, 15310, Puspiptek, Serpong
来源：
APPLIED OPTICS | 1997年 / 36卷 / 01期
关键词：
D O I：
10.1364/AO.36.000266
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new algorithm to reveal the order and sign of fringes formed by dual-beam electronic speckle-pattern interferometry is described. When combined with a previously reported phase-extraction method, it makes possible the evaluation of displacement absolutely and continuously over the entire surface of the object from a total of five frames. This technique is particularly useful when displacement is spatially discontinuous and temporally fast and the amount of data is large. A model experiment showing the validity of this method is presented. (C) 1997 Optical Society of America
引用
收藏
页码：266 / 270
页数：5
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