Plasticity study of deformed materials by in situ atomic force microscopy

被引:35
作者
Coupeau, C [1 ]
Girard, JC [1 ]
Grilhe, J [1 ]
机构
[1] Univ Poitiers, Met Phys Lab, F-86960 Futuroscope, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 04期
关键词
D O I
10.1116/1.590234
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The emerging of a single dislocation at a surface creates a step with a height equal to the Burgers vector component normal to the surface. By coupling an atomic force microscope with a tensile tester, the fine slip line structure can be analyzed. This equipment is particularly suitable to follow the course of plastic flow from the emergence of the first few dislocations from bulk crystal to the stages of work hardening. The motivations, instrumentation and results on LiF single crystal are described. (C) 1998 American Vacuum Society.
引用
收藏
页码:1964 / 1970
页数:7
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