Contactless measurement of critical current of high temperature superconductor tape by magnetic circuit

被引：15

作者：

Gu, C. ^{[1
]}

Qu, T. -M. ^{[2
]}

Zou, S. -N. ^{[2
]}

Han, Z. ^{[2
]}

机构：

[1] Tsinghua Univ, Dept Phys, Appl Superconduct Res Ctr, Beijing 100084, Peoples R China

[2] Tsinghua Univ, Key Lab Adv Mat Proc Technol, Dept Mech Engn, Beijing 100084, Peoples R China

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 08期

基金：

中国国家自然科学基金;

关键词：

CRITICAL-CURRENT-DENSITY; COATED CONDUCTORS;

D O I：

10.1063/1.3473934

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A method based on the principle of the magnetic circuit is proposed and realized for contactless measurement of critical current (I(c)) of high temperature superconductor tapes. This method has two unique features: first, it eliminates noises caused by mechanical fluctuations and thus makes high speed and high stability measurement possible and second, adapts for both Bi(2)Si(2)Ca(2)Cu(3)O(x) (Bi2223) and YBa(2)Cu(3)O(7-x) (YBCO) tape, which even has a magnetic substrate. Theoretical analysis is given and an apparatus for the reel-to-reel measurement has been constructed, by which continuous inspection of I(c) uniformity of YBCO and Bi2223 tapes measured at different speeds is reported. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3473934]

引用

页数：4

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