A novel technique for permittivity and moisture measurements using a planar hybrid junction

被引:1
|
作者
Ocera, A. [1 ]
Dionigi, M. [1 ]
Sorrentino, R. [1 ]
机构
[1] Univ Perugia, DIEI, I-06125 Perugia, Italy
关键词
D O I
10.1109/EUMC.2007.4405163
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel technique for permittivity and moisture measurements overcoming the main limitations of conventional methods is introduced. The technique employs a simple measuring device consisting of a planar hybrid junction with the direct and coupled ports terminated by two identical open-ended transmission lines, one being loaded with the Material Under Test (MUT). The complex permittivity of the MUT is evaluated by simply measuring the amplitudes of the reflected and the transmitted signals of the measuring device. The proposed technique can be adopted to estimate the relative moisture content of solid samples, a simple linear fitting being sufficient to model the relation between tan delta and the moisture percentage. A prototype has been fabricated in microstrip technology employing a multi branch line coupler as hybrid junction. Measured permittivities at 3.5 GHz have been compared with data from the literature, resulting in a good agreement for both epsilon(r) and tan delta.
引用
收藏
页码:210 / 213
页数:4
相关论文
共 50 条
  • [1] An improved technique for permittivity measurements using a coaxial probe
    Blackham, DV
    Pollard, RD
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (05) : 1093 - 1099
  • [2] A novel technique for complex permittivity measurement based on a planar four port device
    Ocera, A.
    Dionigi, M.
    Fratticcioli, E.
    Sorrentino, R.
    35TH EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS, 2005, : 373 - 376
  • [3] PERMITTIVITY MEASUREMENTS USING SPHERICAL SAMPLE MICROWAVE SCATTERING TECHNIQUE
    KELLER, WC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1966, 37 (09): : 1211 - &
  • [4] Measurements of complex permittivity with waveguide resonator using perturbation technique
    Hajian, M
    Mathew, KT
    Ligthart, LP
    MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 1999, 21 (04) : 269 - 272
  • [5] A novel technique for complex permittivity measurement based on a planar four-port device
    Ocera, Alessandro
    Dionigi, Marco
    Fratticcioli, Elisa
    Sorrentino, Roberto
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2006, 54 (06) : 2568 - 2575
  • [6] A novel technique for measuring one-dimensional permittivity profiles using a simple non-commensurate planar structure
    Ocera, Alessandro
    Fratticcioli, Elisa
    Dionigi, Marco
    Sorrentino, Roberto
    IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2008, 18 (03) : 155 - 157
  • [7] Novel technique for planar near-field scattering measurements
    Mao, NH
    Zhang, XM
    1997 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS I-III, 1997, : 897 - 900
  • [8] Planar resonator sensor for moisture measurements
    Skulski, J
    Galwas, BA
    MIKON-98: 12TH INTERNATIONAL CONFERENCE ON MICROWAVES & RADAR, VOLS 1-4, 1998, : 692 - 695
  • [9] Measurements on the Effects of Moisture on the Complex Permittivity of High Temperature Ash
    Baum, Thomas C.
    Ghorbani, Kamran
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2016, 64 (02) : 607 - 615
  • [10] Complex permittivity measurements of moulding plastic using hybrid time and frequency methods
    Elkhazmi, EA
    Abidin, MNZ
    McEwan, NJ
    1997 HIGH FREQUENCY POSTGRADUATE STUDENT COLLOQUIUM, 1997, : 41 - 46