Single-Event Multiple Transients in Conventional and Guard-Ring Hardened Inverter Chains Under Pulsed Laser and Heavy-Ion Irradiation

被引：15

作者：

Chen, Rongmei ^{[1
]}

Zhang, Fengqi ^{[2
]}

Chen, Wei ^{[2
]}

Ding, Lili ^{[2
]}

Guo, Xiaoqiang ^{[2
]}

Shen, Chen ^{[3
]}

Luo, Yinhong ^{[2
]}

Zhao, Wen ^{[2
]}

Zheng, Lisang ^{[3
]}

Guo, Hongxia ^{[2
]}

Liu, Yinong ^{[1
]}

Fleetwood, Daniel M. ^{[4
]}

机构：

[1] Tsinghua Univ, Dept Engn Phys, Key Lab Particle & Radiat Imaging, Minist Educ, Beijing 100084, Peoples R China

[2] Northwest Inst Nucl Technol, State Key Lab Intense Pulsed Radiat Simulat & Eff, Xian 710024, Shaanxi, Peoples R China

[3] Cogenda Co Ltd, Suzhou 215021, Jiangsu, Peoples R China

[4] Vanderbilt Univ, Dept Elect Engn & Comp Sci, 221 Kirkland Hall, Nashville, TN 37235 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2017年 / 64卷 / 09期

基金：

中国国家自然科学基金;

关键词：

Bi; inverter chain; layout design; pulsed laser beam; single-event multiple transients (SEMTs); single-event transient (SET) pulsewidth; 130; NM; PROPAGATION; MITIGATION; UPSET;

D O I：

10.1109/TNS.2017.2738646

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-event multiple transients (SEMTs) are investigated using an on-chip self-triggered circuit. Measured results for inverter chains of two layout designs, including a guard-ring design and a conventional design, are compared under pulsed laser and heavy-ion (Bi) irradiations. Pulsed laser exposures of different energies and Bi heavy-ion irradiation at different injection angles, including along the well direction and across the well direction, are found to produce SEMTs with different probabilities. The use of a guard-ring hardening technique is demonstrated to be very effective in reducing production of SEMTs for inverters without direct electrical connection. Charge sharing-induced SEMTs are found to have different pulsewidth distributions for angled ion incidence than normal ion or laser incidence.

引用

页码：2511 / 2518

页数：8

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