[2] IKERLAN, Ind Cybersecur, Arrasate Mondragon, Spain
来源:
2021 IEEE INTERNATIONAL WORKSHOP ON METROLOGY FOR INDUSTRY 4.0 & IOT (IEEE METROIND4.0 & IOT)
|
2021年
关键词:
Multi-tenancy;
zero defects manufacturing;
D O I:
10.1109/METROIND4.0IOT51437.2021.9488534
中图分类号:
TP301 [理论、方法];
学科分类号:
081202 ;
摘要:
This research paper describes different patterns and best practices to effectively implement multi-tenancy of production sensor data in collaborative applications. The paper explains the design considerations taken to support multi-tenancy in the Zero Defects Manufacturing Platform (ZDMP), using concrete collaborative use cases as an example. The main objective is to provide an overview of multi-tenancy as an enabler of collaborative use cases in digital manufacturing platforms, describe the different design patterns, the main trade-offs, and best practices.