Optimal layout of fringe projection for three-dimensional measurements

We optimize the layout of each light plane in a dual-view multistripe measurement system by employing spatial geometry analysis to avoid ambiguity. The imaging regions of every light plane can be labeled uniquely on two image planes within a certain measurement depth. Moreover, the flexible density of fringe patterns corresponding to the different measurement depths is immediately projected without the conventional coding procedure. Some experiments verify the effectiveness of the proposed method applied in high-resolution 3-D measurements. (c) 2008 Society of Photo-Optical Instrumentation Engineers.