A four-degrees-of-freedom microstage for the compensation of eccentricity of a roundness measurement machine

被引:18
作者
Liu, CH
Jywe, WY [1 ]
机构
[1] Natl Huwei Inst Technol, Dept Automat Engn, Huwei 632, Yunlin, South Korea
[2] Chienkuo Inst Technol, Inst Mechtronopt, Changhua, Taiwan
关键词
roundness test machine; eccentricity; microstage; PZT; self-compensation;
D O I
10.1016/j.ijmachtools.2003.10.025
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper contains a description of four-degrees-of-freedom microstage, designed to replace manual adjustment mechanism in a roundness measurement machine for the compensation of eccentricity. Four-degrees-of-freedom motion (two-translational and two-rotational motion) was obtained by four piezoelectric actuators that were set up on the same plane to minimize the effect of the abbe's offset. The microstage was fixed on a rotary table to compensate not only for the x- and y-position errors, but also for the angle errors about the x- and y-axis. Repeatability, calibration and experimental tests were carried out and the results showed the proposed design was easy to assemble for most types of roundness test machines and had sufficient capability to compensate for the eccentricity. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:365 / 371
页数:7
相关论文
共 8 条
[1]  
GOTO H, 1988, B JPN SOC PREC ENG, V22, P277
[2]   A 6-DEGREES OF FREEDOM FINE MOTION MECHANISM [J].
HENMI, N ;
SATO, K ;
WADA, S ;
SHIMOKOHBE, A .
MECHATRONICS, 1992, 2 (05) :445-457
[3]  
JAMES C, 1996, MECHATRONICS, V6, P523
[4]  
JYWE WY, 1999, MEASUREMENT, V26, P273
[5]   An ultraprecision stage for alignment of wafers in advanced microlithography [J].
Lee, CW ;
Kim, SW .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1997, 21 (2-3) :113-122
[6]  
SMITH AR, 1994, REV SCI INSTRUM, V65, P2252
[7]  
TANIGUCHI M, 1992, INT J JPN S PREC ENG, V26, P35
[8]   Design and characterization of a low-profile micropositioning stage [J].
Yang, RY ;
Jouaneh, M ;
Schweizer, R .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1996, 18 (01) :20-29