Room Temperature Fabrication of High Quality ZrO2 Dielectric Films for High Performance Flexible Organic Transistor Applications

被引:17
作者
Gong, Yanfen [1 ,2 ]
Zhao, Kai [1 ,2 ]
Yan, Longsen [1 ,2 ]
Wei, Weiyao [1 ,2 ]
Yang, Cheng [1 ,2 ]
Ning, Honglong [3 ]
Wu, Sujuan [1 ,2 ]
Gao, Jinwei [1 ,2 ]
Zhou, Guofu [4 ,5 ]
Lu, Xubing [1 ,2 ]
Liu, J. -M. [6 ]
机构
[1] South China Normal Univ, Inst Adv Mat, South China Acad Adv Optoelect, Guangzhou 510006, Guangdong, Peoples R China
[2] South China Normal Univ, Guangdong Prov Lab Quantum Engn & Quantum Mat, Guangzhou 510006, Guangdong, Peoples R China
[3] South China Univ Technol, Inst Polymer Optoelect Mat & Devices, State Key Lab Luminescent Mat & Devices, Guangzhou 510640, Guangdong, Peoples R China
[4] South China Normal Univ, South China Acad Adv Optoelect, Elect Paper Displays Inst, Guangzhou 510006, Guangdong, Peoples R China
[5] South China Normal Univ, South China Acad Adv Optoelect, Guangdong Prov Key Lab Opt Informat Mat & Technol, Guangzhou 510006, Guangdong, Peoples R China
[6] Nanjing Univ, Innovat Ctr Adv Microstruct, Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
OTFT; room temperature fabrication; UV treatment; ZrO2; films; OXIDE GATE DIELECTRICS; ELECTRONIC-STRUCTURE; STACK;
D O I
10.1109/LED.2017.2783945
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
By using low-cost solution process and ultraviolet (UV) irradiation, we successfully fabricated high-quality ZrO2 films at room temperature. The ZrO2 films obtained with 1-h UV curing showed a very low leakage current (1.7 x 10(-6) A/cm(2) at -3 V), a high breakdown electric field 7.9 MV/cm, a high bandgap (6.13 eV), and a high dielectric constant (17.8). The organic thin-film transistor made by solution-processed ZrO2 gate dielectric shows a greatly reduced operation voltage of 4 V, and a high drain current on/off ratio of 3.1 x 106. Furthermore, we also clarified the electronic structures of ZrO2 films with UV curedor thermal annealing. This letter demonstrated that solution-processable ZrO2 film is promising for applications in future low power consumption electronic devices.
引用
收藏
页码:280 / 283
页数:4
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