Comparison of the noise performance of 10 GHz repetition rate quantum-dot and quantum well monolithic mode-locked semiconductor lasers

被引:8
作者
Carpintero, G. [1 ]
Thompson, M. G. [2 ]
Yvind, K. [3 ]
Penty, R. V. [4 ]
White, I. H. [4 ]
机构
[1] Univ Carlos III Madrid, Dept Tecno Elect, Madrid, Spain
[2] Univ Bristol, Dept Elect & Elect Engn, Bristol, Avon, England
[3] DTU Fotonik, Dept Photon Engn, Lyngby, Denmark
[4] Univ Cambridge, Dept Engn, Cambridge CB2 1PZ, England
基金
英国工程与自然科学研究理事会;
关键词
PHOTODETECTORS; REDUCTION; DIODE;
D O I
10.1049/iet-opt.2010.0058
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Mode-locked lasers are commonly used in carrier-wave signal generation systems because of their excellent phase noise performance. Owing to the importance of this key parameter, this study presents a like-for-like comparison of the noise performance of the passive mode-locked regime of two devices fabricated with different material gain systems, one quantum well and the other quantum dot (QD), both with a monolithic all-active two-section mode-locked structure. Two important factors are identified as having a significant effect on the noise performance, the RF linewidth of the first harmonic and the shape of the noise pedestals, both depending on the passive mode-locked bias conditions. Nevertheless, the dominant contribution of the RF linewidth to the phase noise, which is significantly narrower for the QD laser, makes this material more suitable for optical generation of low-noise millimetre-wave carrier frequencies.
引用
收藏
页码:195 / 201
页数:7
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