Structural origins of relaxor behavior in a 0.96(Bi1/2Na1/2)TiO3-0.04BaTiO3 single crystal under electric field

被引:59
作者
Daniels, John E. [1 ]
Jo, Wook [2 ]
Roedel, Juergen [2 ]
Rytz, Daniel [3 ]
Donner, Wolfgang [2 ]
机构
[1] Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
[2] Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany
[3] FEE GmbH, D-55743 Idar Oberstein, Germany
关键词
barium compounds; bismuth compounds; dielectric polarisation; nanostructured materials; permittivity; relaxor ferroelectrics; sodium compounds; X-ray scattering; LEAD-FREE PIEZOCERAMICS; PHASE-TRANSITIONS; NA0.5BI0.5TIO3; DIFFRACTION; MICROSCOPY; CERAMICS;
D O I
10.1063/1.3602316
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diffuse x-ray scattering intensities from a single crystal of 0.96(Bi1/2Na1/2TiO3)-0.04(BaTiO3) have been collected at room temperature with and without application of an electric field along the [100] direction. Distinct features in the diffuse scattering intensities indicate correlations on a nanometer length scale. It is shown that locally correlated planar-like structures and octahedral tilt-domains within the room temperature rhombohedral R3c phase are both electrically active and are irreversibly affected by application of an electric field of 4.3 kV/mm. The field dependence of these nanoscale structures is correlated with the relaxor behavior of the material by macroscopic permittivity measurements. (C) 2011 American Institute of Physics. [doi:10.1063/1.3602316]
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页数:3
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