共 18 条
[1]
Bernasconi A, 2019, DES AUT TEST EUROPE, P1655, DOI [10.23919/date.2019.8715286, 10.23919/DATE.2019.8715286]
[2]
Chakraborti S, 2014, INT DES TEST SYMP, P136, DOI 10.1109/IDT.2014.7038601
[4]
Frerix S., 2019, NANOARCH
[5]
Gaillardon PE, 2016, DES AUT TEST EUROPE, P427
[6]
Haensch W, 2018, INT EL DEVICES MEET
[7]
Hashemi S, 2015, ICCAD-IEEE ACM INT, P418, DOI 10.1109/ICCAD.2015.7372600
[8]
Lai YA, 2018, DES AUT TEST EUROPE, P773, DOI 10.23919/DATE.2018.8342111
[9]
Lee S, 2017, DES AUT TEST EUROPE, P187, DOI 10.23919/DATE.2017.7926980
[10]
Reliability of CMOS integrated memristive HfO2 arrays with respect to neuromorphic computing
[J].
2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS),
2019,