Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene

被引：6
|
作者：
Islam, Md. Sherajul [1 ]
Bhuiyan, A. G. [2 ]
Tanaka, S. [3 ]
Makino, T. [1 ]
Hashimoto, A. [1 ]
机构：
[1] Univ Fukui, Grad Sch Elect & Elect Engn, Fukui 9108507, Japan
[2] Khulna Univ Engn & Technol, Dept Elect & Elect Engn, Khulna 9203, Bangladesh
[3] Kyushu Univ, Dept Appl Quantum Phys & Nucl Engn, Fukuoka 8190395, Japan
来源：
APPLIED PHYSICS LETTERS | 2014年 / 105卷 / 24期
关键词：
RIBBONS; STATE; MODE;
D O I：
10.1063/1.4904469
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
This letter performed polarized microscopic laser Raman scattering spectroscopy on the curved edges of transferred epitaxial graphene on SiO2/Si. The intensity ratio between the parallel and perpendicular polarized D band is evolved, providing a spectroscopy-based technique to probe the atomic-scale edge structures in graphene. A detailed analysis procedure for non-ideal disordered curved edges of graphene is developed combining the atomic-scale zigzag and armchair edge structures along with some point defects. These results could provide valuable information of the realistic edges of graphene at the atomic-scale that can strongly influence the performance of graphene-based nanodevices. (C) 2014 AIP Publishing LLC.
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页数：4
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