Development of a Through-Silicon Via (TSV) Process Module for Multi-Project Wafer SiGe BiCMOS and Silicon Interposer

被引:5
|
作者
Wietstruck, M. [1 ]
Marschmeyer, S. [1 ]
Kulse, P. [1 ]
Voss, T. [1 ]
Lisker, M. [1 ]
Krueger, A. [1 ]
Wolansky, D. [1 ]
Fraschke, M. [1 ]
Kaynak, M. [1 ,2 ]
机构
[1] IHP, Technol Pk 25, D-15236 Frankfurt, Oder, Germany
[2] Sabanci Univ, Elect Engn, TR-34956 Tuzla, Turkey
关键词
Through-Silicon Via; BiCMOS; Interposer; 3D-Integration; Packaging;
D O I
10.1109/ECTC.2018.00341
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, the development of a Through-Silicon Via process module for multi-project wafer SiGe BiCMOS and silicon interposer is demonstrated. The TSV technology based on a via-middle approach is optimized to provide TSV process and design flexibility which is required for a multi-project wafer service. Different passive and active TSV-based components like a low-noise amplifier, RF interposer transmission lines and substrate-integrated waveguides are fabricated. The TSV process module enables a wide range of promising new applications by adding additional functionalities to conventional BiCMOS and interposer substrate technologies.
引用
收藏
页码:2267 / 2274
页数:8
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