A New Probe for Electromagnetic Compatibility and Electromagnetic Interference Detection

被引：1
作者：
Xiao, Ke [1 ]
Chen, Zhirun [1 ]
Zheng, Wei [1 ]
机构：
[1] Chongqing Univ, Coll Optoelect Engn, Chongqing, Peoples R China
来源：
2020 5TH INTERNATIONAL CONFERENCE ON MECHANICAL, CONTROL AND COMPUTER ENGINEERING (ICMCCE 2020) | 2020年
关键词：
Probe; electromagnetic interference; electromagnetic compatibility; conductor backed coplanar waveguide; NEAR-FIELD PROBES;
D O I：
10.1109/ICMCCE51767.2020.00026
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, a new probe for electromagnetic compatibility and electromagnetic interference detection is proposed, designed, and simulated. ANSYS HFSS software is used to design a 3D model and simulate the probe. The simulation result shows that the working frequency band is up to 3 GHz and spatial resolution is less than 4 mm for magnetic and electric field detection. These parameters show a good ability for locating the interference source. The new structure is able to measure the electric and magnetic field simultaneously, improve the efficiency of the near field detection greatly.
引用
收藏
页码：85 / 88
页数：4
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