Far infrared response of intrinsic Josephson junctions

被引：13
|
作者：
Rother, S [1 ]
Kleiner, R
Müller, P
Darula, M
Kasai, Y
Nakajima, K
机构：
[1] Univ Erlangen Nurnberg, Inst Phys 3, D-91058 Erlangen, Germany
[2] Lehrstuhl Expt Phys 2, Inst Phys, D-72076 Tubingen, Germany
[3] Forschungszentrum Julich, Inst Schicht & Ionentech, D-52425 Julich, Germany
[4] Electrotech Lab, Tsukuba, Ibaraki 305, Japan
[5] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 98077, Japan
来源：
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2000年 / 341卷
关键词：
D O I：
10.1016/S0921-4534(00)01339-3
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We present experiments on far infrared response of intrinsic Josephson junctions in Bi(2)Sr(2)CaCu(2)O(8+x). The frequencies we used were between 584 GHz and 762 GHz, well above the plasma frequency of our junctions. By varying the frequency and the power of the radiation we examined the occurence and stability of the Shapiro steps. Furthermore the temperature and power dependence of the step amplitude was investigated.
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页码：1565 / 1566
页数：2
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