The Study of 4H-SiC Alpha Particle Detectors with Different Schottky Contact Metallization

被引:4
作者
Zat'ko, Bohumir [1 ]
Dubecky, Frantisek [1 ]
Ryc, Leszek [2 ]
Sagatova, Andrea [3 ,4 ]
Sedlackova, Katarina [3 ]
Kovacova, Eva [1 ]
Necas, Vladimir [3 ]
机构
[1] Slovak Acad Sci, Inst Elect Engn, Dubravska Cesta 9, SK-84104 Bratislava, Slovakia
[2] Inst Plasma Phys & Laser Microfus, PL-00908 Warsaw, Poland
[3] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Technol, Ilkovicova 3, SK-81219 Bratislava, Slovakia
[4] Slovak Med Univ, Univ Ctr Electron Accelerators, Ku Kyselke 497, SK-91106 Trencin, Slovakia
来源
APPLIED PHYSICS OF CONDENSED MATTER (APCOM 2018) | 2018年 / 1996卷
关键词
SILICON-CARBIDE;
D O I
10.1063/1.5048903
中图分类号
O59 [应用物理学];
学科分类号
摘要
We fabricated and characterized 4H-SiC Schottky diodes as a spectrometric detector of alpha particles. Two types of blocking contacts based on Ni/Au and Pt/Au were used. The total thickness of prepared blocking contacts was about 15 nm to minimize the influence on alpha particles energy resolution. Current-voltage characteristics of two types of detectors were measured at room temperature and compared. As a source of alpha particles we utilized triple radioisotope of Pu-239 Am-241 Cm-244. Detected alpha particles had energies from 5.1 MeV up to 5.8 MeV. The spectrometric performance of detectors with two types of blocking contacts were evaluated and compared.
引用
收藏
页数:5
相关论文
共 50 条
  • [21] Schottky barrier detectors based on high quality 4H-SiC semiconductor: Electrical and detection properties
    Zatko, B.
    Hrubcin, L.
    Sagatova, A.
    Osvald, J.
    Bohacek, P.
    Zaprazny, Z.
    Sedlackova, K.
    Sekacova, M.
    Dubecky, F.
    Skuratov, V. A.
    Korytar, D.
    Necas, V.
    APPLIED SURFACE SCIENCE, 2018, 461 : 276 - 280
  • [22] Dose Rate Linearity in 4H-SiC Schottky Diode-Based Detectors at Elevated Temperatures
    Mohamed, N. S.
    Wright, N. G.
    Horsfall, A. B.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 64 (07) : 1912 - 1919
  • [23] Characterization of epitaxial 4H-SiC for photon detectors
    Dubecky, F.
    Gombia, E.
    Ferrari, C.
    Zat'ko, B.
    Vanko, G.
    Baldini, M.
    Kovac, J.
    Bacek, D.
    Kovac, P.
    Hrkut, P.
    Necas, V.
    JOURNAL OF INSTRUMENTATION, 2012, 7
  • [24] Study of 4H-SiC JBS Diodes Fabricated with Tungsten Schottky Barrier
    M. Berthou
    P. Godignon
    J. Montserrat
    J. Millan
    D. Planson
    Journal of Electronic Materials, 2011, 40 : 2355 - 2362
  • [25] Response of 4H-SiC Detectors to Ionizing Particles
    Bernat, Robert
    Capan, Ivana
    Bakrac, Luka
    Brodar, Tomislav
    Makino, Takahiro
    Ohshima, Takeshi
    Pastuovic, Zeljko
    Sarbutt, Adam
    CRYSTALS, 2021, 11 (01) : 1 - 13
  • [26] Study of 4H-SiC JBS Diodes Fabricated with Tungsten Schottky Barrier
    Berthou, M.
    Godignon, P.
    Montserrat, J.
    Millan, J.
    Planson, D.
    JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (12) : 2355 - 2362
  • [27] Study on 4H-SiC Trench Schottky-Type Neutron Detector
    Jiang, Wan-Chen
    Wang, Ying
    Hong, Bing
    Liu, Yun-Tao
    Zhang, Rui
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 73
  • [28] The thermal stability study and improvement of 4H-SiC ohmic contact
    Liu, Shengbei
    He, Zhi
    Zheng, Liu
    Liu, Bin
    Zhang, Feng
    Dong, Lin
    Tian, Lixin
    Shen, Zhanwei
    Wang, Jinze
    Huang, Yajun
    Fan, Zhongchao
    Liu, Xingfang
    Yan, Guoguo
    Zhao, Wanshun
    Wang, Lei
    Sun, Guosheng
    Yang, Fuhua
    Zeng, Yiping
    APPLIED PHYSICS LETTERS, 2014, 105 (12)
  • [29] Parameter extraction for a Ti/4H-SiC Schottky diode
    Wang, SG
    Zhang, YM
    Zhang, YM
    CHINESE PHYSICS, 2003, 12 (01): : 94 - 96
  • [30] Electrical and ultraviolet characterization of 4H-SiC Schottky photodiodes
    Lioliou, G.
    Mazzillo, M. C.
    Sciuto, A.
    Barnett, A. M.
    OPTICS EXPRESS, 2015, 23 (17): : 21657 - 21670