X-ray powder structural and microstructural study of nanocrystalline copper oxide

被引：1

作者：

Massarotti, V

Capsoni, D

Bini, M

Altomare, A

Moliterni, AGG

机构：

[1] Univ Pavia, Dipartimento Chim Fis & CSTE, CNR, I-27100 Pavia, Italy

[2] CNR, Ist Ric Sviluppo Metodol Cristallog, Dipartimento Geomineral, I-70125 Bari, Italy

来源：

EPDIC 5, PTS 1 AND 2 | 1998年 / 278-2卷

关键词：

CuO; X-ray powder diffraction; structure; microstructure;

D O I：

10.4028/www.scientific.net/MSF.278-281.873

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The results of structure determination procedure from the X-lay powder pattern of nanocrystalline CuO samples are presented. It has been demonstrated that, notwithstanding the low resolution of the pattern, the extraction of the structure factors and the determination of atomic positions can be favourably performed. It has been also observed that the microstructural aspects are remarkably important for samples prepared at low temperature. In particular it is important to take into account the strain effects to obtain the best interpretation of the observed peak profile broadening.

引用

页码：873 / 878

页数：6

共 12 条

[1] On the number of statistically independent observations in a powder diffraction pattern [J].