Deuterated Glycine Phosphite single crystals were grown by low temperature solution growth method using high purity deuterated water as solvent. Deuteration content of the as grown crystals was improved by repeated recrystallisation process. Structural perfection, transparency and the functional groups present in the grown crystals were identified using different characterization analyses. Dielectric behaviors of the as grown specimens were examined through thermal and impedance analysis. Partial deuteration of the grown crystal was confirmed from the DSC and dielectric results. (C) 2010 Elsevier B.V. All rights reserved.
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Anna Univ, Dept Phys, Crystal Res Lab, Madras 600025, Tamil Nadu, India
KLN Coll Engn, Dept Phys, Pottapalayam 630611, IndiaAnna Univ, Dept Phys, Crystal Res Lab, Madras 600025, Tamil Nadu, India
Srinivasan, T. P.
Indirajith, R.
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Anna Univ, Dept Phys, Crystal Res Lab, Madras 600025, Tamil Nadu, IndiaAnna Univ, Dept Phys, Crystal Res Lab, Madras 600025, Tamil Nadu, India
Indirajith, R.
Gopalakrishnan, R.
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Anna Univ, Dept Phys, Crystal Res Lab, Madras 600025, Tamil Nadu, IndiaAnna Univ, Dept Phys, Crystal Res Lab, Madras 600025, Tamil Nadu, India
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Royal Inst Technol, Sch Informat & Commun Technol, Div Semicond Mat, S-16440 Kista, Sweden
Anna Univ, Ctr Crystal Growth, Madras 25, Tamil Nadu, IndiaRoyal Inst Technol, Sch Informat & Commun Technol, Div Semicond Mat, S-16440 Kista, Sweden
Perumal, R.
Babu, S. Moorthy
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Anna Univ, Ctr Crystal Growth, Madras 25, Tamil Nadu, IndiaRoyal Inst Technol, Sch Informat & Commun Technol, Div Semicond Mat, S-16440 Kista, Sweden