Special Session: Hot Topic Design and Test of 3D and Emerging Memories

被引：0
|
作者：
Wu, Cheng-Wen [1 ]
机构：
[1] Natl Tsing Hua Univ, ITRI, Hsinchu, Taiwan
来源：
2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS) | 2011年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：328 / 328
页数：1
相关论文
共 50 条
  • [31] Challenges of CMP Technology for 3D Memories
    Matsui, Yukiteru
    2014 INTERNATIONAL CONFERENCE ON PLANARIZATION/CMP TECHNOLOGY (ICPT), 2014, : 3 - 3
  • [32] 3D stacked NAND flash memories
    Micheloni, Rino
    Crippa, Luca
    3D Flash Memories, 2016, : 63 - 83
  • [33] DATE98 hot topic session: IP-based system-on-a-chip design
    De Loore, B
    DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, 1998, : 290 - 290
  • [34] Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories
    Brozek, Tomasz
    Ciplickas, Dennis
    IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2019, 7 (01) : 1248 - 1257
  • [35] Special Session: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies
    Pavanello, Fabio
    Vatajelu, Elena Ioana
    Bosio, Alberto
    Van Vaerenbergh, Thomas
    Bienstman, Peter
    Charbonnier, Benoit
    Carpegna, Alessio
    Di Carlo, Stefano
    Savino, Alessandro
    2023 IEEE 41ST VLSI TEST SYMPOSIUM, VTS, 2023,
  • [36] Special Session: Emerging Architecture Design, Control, and Security Challenges in Software Defined Vehicles
    El-Fatyany, Aya
    Wang, Xiaohang
    Duggirala, Parasara Sridhar
    Chakraborty, Samarjit
    Pasricha, Sudeep
    Singh, Amit Kumar
    2024 INTERNATIONAL CONFERENCE ON HARDWARE/SOFTWARE CODESIGN AND SYSTEM SYNTHESIS, CODES+ISSS 2024, 2024, : 31 - 40
  • [37] Efficient Test and Repair Architectures for 3D TSV-Based Random Access Memories
    Lu, Shyue-Kung
    Lu, Uang-Chang
    Pong, Seng-Wen
    Cheng, Hao-Cheng
    2013 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION, AND TEST (VLSI-DAT), 2013,
  • [38] Efficient Test and Repair Architectures for 3D TSV-Based Random Access Memories
    Lu, Shyue-Kung
    Lu, Uang-Chang
    Pong, Seng-Wen
    Cheng, Hao-Cheng
    2013 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION, AND TEST (VLSI-DAT), 2013,
  • [39] Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis
    Bishnoi, Rajendra
    Wu, Lizhou
    Fieback, Moritz
    Muench, Christopher
    Nair, Sarath Mohanachandran
    Tahoori, Mehdi
    Wang, Ying
    Li, Huawei
    Hamdioui, Said
    2020 IEEE 38TH VLSI TEST SYMPOSIUM (VTS 2020), 2020,
  • [40] Introduction to the Special Session on "Interconnect Enhances Architecture: Evolution of Wireless NoC from Planar to 3D"
    Marculescu, Radu
    Pande, Partha Pratim
    Heo, Deukhyoun
    Matsutani, Hiroki
    2014 EIGHTH IEEE/ACM INTERNATIONAL SYMPOSIUM ON NETWORKS-ON-CHIP (NOCS), 2014, : 174 - 175
12345