Electric field-induced carbon nanotube junction formation

被引：54

作者：

Ho, GW ^{[1
]}

Wee, ATS ^{[1
]}

Lin, J ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Phys, Singapore 119260, Singapore

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 02期

关键词：

D O I：

10.1063/1.1383279

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present experimental evidence of nanojunction structures explicitly observed after application of high electric fields on multiwall carbon nanotube arrays. The electric field as well as thermal effects result in carbon-carbon bond breaking and redeposition leading to nanojunction formation. The growth mechanism of the nanojunction is believed to be open-ended topological defect growth in which carbon atoms at two adjacent nanotube tips chemically react and fuse forming an array of nanojunctions. (C) 2001 American Institute of Physics.

引用

页码：260 / 262

页数：3

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