Development of SOI High Voltage CMOS process for Plasma Display Panel driver ICs

被引:0
作者
Kobayashi, K [1 ]
Yanagigawa, H [1 ]
Mori, K [1 ]
Yamanaka, S [1 ]
Fujiwara, A [1 ]
机构
[1] NEC Corp Ltd, Semicond Div, Tokyo, Japan
来源
NEC RESEARCH & DEVELOPMENT | 1998年 / 39卷 / 04期
关键词
SOI (Silicon-On-Insulator); trench; dielectric isolation; High Voltage CMOS (HV-CMOS); level shifter; PDP (Plasma Display Panel) driver;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
For Plasma Display Panel (PDP) driver ICs, a new High Voltage CMO (HV-CMOS) process utilizing the bonded SOI (Silicon-On-Insulator) substrate has been developed. The dielectric isolation has been realized by SOI and trench process. 0.5 mu m rule CMOS process has been adopted for the first time in the HV-CMOS process. In this process, 5 V logic circuit and high voltage output circuit can be integrated densely on a same chip. The 200 V rating n-channel MOSFET (NMOS) and p-channel Double-Diffused MOSFET (PDMOS) have been fabricated on 5 mu m-thick SOI and sufficient electrical characteristics for the PDP driver IC have been achieved. The chip size of the fabricated PDP scan driver IC could be reduced by 40% compared with the conventional one and high-speed switching function has been confirmed.
引用
收藏
页码:508 / 514
页数:7
相关论文
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