Tapping mode atomic force microscope combined with reflection scanning near-field optical microscope (AF/RSNOM)

被引：1
|
作者：
Li, YL [1 ]
Wu, SF [1 ]
Li, PF [1 ]
Zhang, J [1 ]
Pan, S [1 ]
机构：
[1] Dalian Univ Technol, Dept Phys, Inst Near Field Opt & Nanotechnol, Dalian 116024, Peoples R China
来源：
OPTICS COMMUNICATIONS | 2006年 / 258卷 / 02期
基金：
中国国家自然科学基金;
关键词：
reflection SNOM; AFM; SNOM; super resolution optical microscope;
D O I：
10.1016/j.optcom.2005.07.066
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new kind of scanning probe microscope is introduced in this paper, which is a combination of atomic force microscope and reflection scanning near field optical microscopy (AF/RSNOM) with equi-amplitude tapping mode. The principle and recent experiment result of AF/RSNOM are reported. Besides convenient operation, the bi-functional probe tip of AF/RSNOM brings an even illumination for every sampling position. Experiment result and analysis show that the signal to noise ratio (SNR) of AF/RSNOM optical image is much better than that of other RSNOM without tapping working mode. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：275 / 279
页数：5
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