Optical Properties of Low-Loss Ag Films and Nanostructures on Transparent Substrates

被引:9
作者
Mori, Tomohiro [1 ]
Mori, Takeshi [1 ]
Fujii, Masamitsu [2 ]
Tominari, Yukihiro [3 ]
Otomo, Akira [3 ]
Yamaguchi, Kenzo [4 ,5 ]
机构
[1] Ind Technol Ctr Wakayama Prefecture, Ogura 60, Wakayama, Wakayama 6496261, Japan
[2] Toba Natl Coll Maritime Technol, Dept Elect & Mech, Ikegami 1-1, Toba, Mie 5178501, Japan
[3] Natl Inst Informat & Commun Technol, Adv ICT Res Inst, Iwaoka 588-2, Kobe, Hyogo 6512492, Japan
[4] Kagawa Univ, Dept Adv Mat Sci, Fac Engn, Hayashicho 2217-20, Takamatsu, Kagawa 7610396, Japan
[5] Univ Cambridge, Dept Phys, Cavendish Lab, NanoPhoton Ctr, JJ Thomson Ave, Cambridge CB3 0HE, England
关键词
surface plasmon; silver; ellipsometry; single-crystalline film; polycrystalline film; epitaxial growth technique; film-transfer technique; nanostructure; CRYSTALLINE SILVER FILMS; SINGLE-CRYSTALLINE; PROPAGATION; PLASMONICS; GROWTH; SERS;
D O I
10.1021/acsami.7b18367
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We demonstrate the fabrication of a low-loss single crystalline Ag nanostructure deposited on transparent substrates. Our approach is based on an epitaxial growth technique in which a NaCl(001) substrate is used. The NaCl substrate is dissolved in water to allow the Ag film to be transferred onto the desired substrates. Focused ion beam milling is subsequently employed to pattern a nanoarray structure consisting of 200 nanorods. The epitaxial Ag films with nanoarray structures grown in the study exhibited very flat and smooth surfaces having excellent crystallinity and local misorientation of less than 1 degrees Further, spectroscopic ellipsometry measurements indicated that the imaginary part of the dielectric constant of the single-crystalline film was smaller than that of a conventional polycrystalline film. Moreover, we used the three-dimensional finite-difference time-domain method to analyze the plasmonic properties of the nanoarray structure by considering the actual processed structure. Characteristically, when the SiO2 substrate was etched by ion beam milling to a depth of 30 nm, the spectrum showed a spectral shape 20% sharper than that of the substrate with no etching (depth: 0 nm). The plasmonic performance of the single-crystalline Ag nanostructure was largely determined by its structural precision and the dielectric properties of the metal.
引用
收藏
页码:8333 / 8340
页数:8
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