Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications

被引:1
|
作者
Sheng, Duo [1 ]
Hung, Yu-Chan [1 ]
机构
[1] Fu Jen Catholic Univ, Dept Elect Engn, New Taipei 24205, Taiwan
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 11期
关键词
D O I
10.1063/1.4968533
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper presents an on-chip delay measurement (OCDM) circuit with a wide delay-measurement range, a high delay-measurement resolution and low supply-voltage sensitivity for efficient detection, and diagnosis in the high-performance system-on-chip (SoC). The proposed cascade-stage measurement structure can simultaneously achieve a delay-measurement range of several nanoseconds and a quantization resolution of several picoseconds. The proposed delay-measurement circuit has a high immunity to supply voltage variations without any additional calibration or self-biasing circuit. The delay-measurement range is 5.25 ns with 6 ps resolution; and the average delay resolution variation is 0.41% with +/-10% supply voltage variations. Published by AIP Publishing.
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页数:3
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