Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications
被引:1
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作者:
Sheng, Duo
论文数: 0引用数: 0
h-index: 0
机构:
Fu Jen Catholic Univ, Dept Elect Engn, New Taipei 24205, TaiwanFu Jen Catholic Univ, Dept Elect Engn, New Taipei 24205, Taiwan
Sheng, Duo
[1
]
Hung, Yu-Chan
论文数: 0引用数: 0
h-index: 0
机构:
Fu Jen Catholic Univ, Dept Elect Engn, New Taipei 24205, TaiwanFu Jen Catholic Univ, Dept Elect Engn, New Taipei 24205, Taiwan
Hung, Yu-Chan
[1
]
机构:
[1] Fu Jen Catholic Univ, Dept Elect Engn, New Taipei 24205, Taiwan
来源:
REVIEW OF SCIENTIFIC INSTRUMENTS
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2016年
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87卷
/
11期
关键词:
D O I:
10.1063/1.4968533
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
This paper presents an on-chip delay measurement (OCDM) circuit with a wide delay-measurement range, a high delay-measurement resolution and low supply-voltage sensitivity for efficient detection, and diagnosis in the high-performance system-on-chip (SoC). The proposed cascade-stage measurement structure can simultaneously achieve a delay-measurement range of several nanoseconds and a quantization resolution of several picoseconds. The proposed delay-measurement circuit has a high immunity to supply voltage variations without any additional calibration or self-biasing circuit. The delay-measurement range is 5.25 ns with 6 ps resolution; and the average delay resolution variation is 0.41% with +/-10% supply voltage variations. Published by AIP Publishing.