Establishment and application of the 0/45 reflectance factor scale over the shortwave infrared

被引:4
作者
Cooksey, Catherine C. [1 ]
Allen, David W. [1 ]
Tsai, Benjamin K. [1 ]
Yoon, Howard W. [1 ]
机构
[1] NIST, Gaithersburg, MD 20899 USA
关键词
Budget control - Semiconducting gallium - Infrared radiation - Reflection - III-V semiconductors - Gallium arsenide - Reflectometers - Uncertainty analysis;
D O I
10.1364/AO.54.003064
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper describes the establishment and application of the 0/45 reflectance factor scale in the short-wave infrared (SWIR) from 1100 to 2500 nm. Design, characterization, and the demonstration of a four-stage, extended indium-gallium-arsenide radiometer to perform reflectance measurements in the SWIR have been previously discussed. Here, we focus on the incorporation of the radiometer into the national reference reflectometer, its validation through comparison measurements, and the uncertainty budget. Next, this capability is applied to the measurement of three different diffuser materials. The 0/45 spectral reflectance factors for these materials are reported and compared to their respective 6/di spectral reflectance factors.
引用
收藏
页码:3064 / 3071
页数:8
相关论文
共 15 条
[1]  
[Anonymous], 1977, TECHNICAL REPORT
[2]  
Barnes P. Y., 1999, Spectral reflectance
[3]  
Barnes P. Y., 1995, 1413 NIST US DEP COM
[4]   SWIR CALIBRATION OF SPECTRALON REFLECTANCE FACTOR [J].
Georgiev, Georgi T. ;
Butler, James J. ;
Cooksey, Catherine ;
Ding, Leibo ;
Thome, Kurtis J. .
SENSORS, SYSTEMS, AND NEXT-GENERATION SATELLITES XV, 2011, 8176
[5]   New robot-based gonioreflectometer for measuring spectral diffuse reflection [J].
Huenerhoff, D. ;
Grusemann, U. ;
Hoepe, A. .
METROLOGIA, 2006, 43 (02) :S11-S16
[6]   SPECTROPHOTOMETER LINEARITY TESTING USING DOUBLE-APERTURE METHOD [J].
MIELENZ, KD ;
ECKERLE, KL .
APPLIED OPTICS, 1972, 11 (10) :2294-&
[7]   The NIST Robotic Optical Scatter Instrument (ROSI) and its Application to BRDF Measurements of Diffuse Reflectance Standards for Remote Sensing [J].
Patrick, Heather J. ;
Zarobila, Clarence J. ;
Germer, Thomas A. .
EARTH OBSERVING SYSTEMS XVIII, 2013, 8866
[8]  
Root J., 2014, COMMUNICATION
[9]  
Taylor B., 1994, NIST TECHNICAL NOTE, V1297
[10]   ESTABLISHING A SCALE OF DIRECTIONAL-HEMISPHERICAL REFLECTANCE FACTOR-1 - VANDENAKKER-METHOD [J].
VENABLE, WH ;
HSIA, JJ ;
WEIDNER, VR .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1977, 82 (01) :29-55