Emission Simulation and Secondary Electron Emission Measurement of the Cathode in High-Power Continuous Wave Magnetron Tubes

被引：0

作者：

Qi, Shikai ^{[1
]}

Wang, Xiaoxia ^{[1
]}

Luo, Jirun ^{[1
]}

Hu, Mingwei ^{[1
]}

Zhao, Shike ^{[1
]}

Li, Yun ^{[1
]}

Zhang, Qi ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Elect, Key Lab High Power Microwave Sources & Technol, Beijing 100190, Peoples R China

来源：

2015 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC) | 2015年

关键词：

resistive electron bombing; alloy cathode; secondary electron emission yield (SEEY); thermostability; CST simulation;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Energy and local distribution of electron around the cathode have been simulated in a 30kW continuous wave magnetron tube which operates in normal output power. According to the simulation results, it is clearly that the cathode of magnetron is bombed by low energy electrons mostly among 0 and 2keV. Based on the fact that most of the back bombardment electron belong to low energy electron, when the energy of incident electron is among 0 and 2keV, the secondary electron emission yield (SEEY) of cathodes provided with different mass percent Re doping W-Re alloy are measured, eventually, we obtain the maximum SEEY of W-Re alloy cathode when adopted by 5% Re doping.

引用

页数：2

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