Interface mediated enhanced mixing of multilayered Ni-Bi thin films by swift heavy ion irradiation

被引：4
作者：
Siva, V. [1 ]
Chettah, A. [2 ]
Ojha, S. [3 ]
Tripathi, A. [3 ]
Kanjilal, D. [3 ]
Sahoo, Pratap K. [1 ]
机构：
[1] Natl Inst Sci Educ & Res, Sch Phys Sci, HBNI, Jatni 752050, India
[2] Univ 20 Aout 1955, Lab LGMM, Grp Mat Fonct, Skikda, Algeria
[3] Interuniv Accelerator Ctr, Aruna Asaf Ali Marg, New Delhi 110067, India
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2017年 / 409卷
关键词：
Ion beam mixing; RBS; XRD; FESEM; TRANSIENT THERMAL-PROCESS; THERMODYNAMIC OPTIMIZATION; SPIKE DESCRIPTION; BEAM ANALYSIS; TEMPERATURE; BILAYERS; METALS; SYSTEM;
D O I：
10.1016/j.nimb.2017.03.074
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report the effect of ion beam mixing of Ni/Bi multilayers using 100 MeV Au ions as a function of irradiation fluences. X-ray diffraction study reveals the higher magnitude of NiBi3 and NiBi phases compared to elemental Ni and Bi after ion irradiation. We observe an evolution of grainy structures to a molten-like surface with increasing ion fluences. These features were also reflected in the Rutherford Backscattering spectrometry spectra, in terms of the enhanced mixing with increasing ion fluences. The experimental findings were understood on the basis of inelastic thermal spike model calculations. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码：314 / 317
页数：4
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