Noise measurement techniques

The following topics will be considered: Noise characterisation of voltage amplifiers in series. Noise measuring set-up with dc excitation and single ended ac-amplifier or differential amplifier in a bridge configuration. Bias and sample criteria to observe 1/f noise in homogeneous samples submitted to homogeneous fields. Criteria for highest S-V value and highest corner frequency f(c) between 1/f and thermal noise. Eddy current shielding (on wafer level measurements). Calculation of S-R from S-V or current spectra S-1 in different bias circuits. Contact noise reduction in a four probe configuration, by good sample design Noise correlation measurements.