Delocalized radiation damage in polymers

被引：36
作者：
Egerton, R. F. [1 ]
Lazar, S. [2 ,3 ]
Libera, M. [4 ]
机构：
[1] Univ Alberta, Dept Phys, Edmonton, AB, Canada
[2] McMaster Univ, Canadian Ctr Electron Microscopy, Dept Mat Sci & Engn, Hamilton, ON L8S 4M1, Canada
[3] FEI Electron Opt, NL-5600 KA Eindhoven, Netherlands
[4] Stevens Inst Technol, Dept Chem Engn & Mat Sci, Hoboken, NJ 07030 USA
来源：
MICRON | 2012年 / 43卷 / 01期
关键词：
EELS; Radiation damage; Polymers; Delocalization; ELECTRONS;
D O I：
10.1016/j.micron.2011.05.007
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We present and discuss measurements of electron-irradiation damage in polystyrene and other polymers, based on fading of the 7-eV energy-loss peak. These measurements suggest a large increase in characteristic dose as the electron-beam diameter is reduced from 1 mu m to below 1 nm. This finding is discussed in terms of secondary-electron production and delocalization of the inelastic scattering, both as it affects the volume of specimen in which the energy is deposited and the volume giving rise to the inelastic signal used to assess the damage. (C) 2011 Elsevier Ltd. All rights reserved.
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页码：2 / 7
页数：6
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